Imagine Optic Wavefront Sensor HASO 4 First delivers accurate, reliable and fast measurement at the wavelength of your choice. This HASO is based on a camera offering the best industrial standards in term of reliability, and high wavefront measurement performance thanks to the unique characteristics coming with each of our products : factory calibration, advanced software and high quality hardware.
The HASO4 FIRST is a top choice for adaptive optics applications for microscopy or UHIL. It is also very relevant option for OEM applications in optical metrology and beam diagnostics. Wavefront acquisition can be performed up to 99 Hz or in high-speed mode at 165 Hz. Either way, HASO4 FIRST offers reliable wavefront metrology for a large range of applications including fundamental research, prototype development or quality control in production.
HASO4 FIRST is delivered with WaveView, the 3rd generation of our wavefront analysis software offering more than 150 functions and optional add-ons offering advanced determination of PSF, MTF, Strehl ratio and M². Available as an option, WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 FIRST into any custom systems. On request, customized software solutions, perfectly adapted to your application case can be developed.
- λ/100 rms absolute accuracy over 400λ dynamic range
- patented measurement of phase and intensity, simultaneously and independently
- patented microlens array technology manufactured in-house
- frame rate of 99 Hz for high-resolution or 165 Hz for high-speed acquisition
- WaveView, the industry’s most complete software package, included
- WaveKit or SDK of WaveView compatible with C, LabVIEW and MATLAB
- C-mount compatible entrance aperture – external trigger capability
|Aperture dimension||3.6 x 4.6 mm²|
|Number of microlenses||32 x 40|
|Tilt dynamic range||> ± 3 ° (400 λ)|
|Focus dynamic range||± 0.018 m to ± ∞ (350 λ)|
|Focus dynamic range – maximum NA||0.1|
|Repeatability (rms)||< λ/200|
|Wavefront measurement accuracy in relative mode (rms)*||~ λ/150|
|Wavefront measurement accuracy in absolute mode (rms)**||~ λ/100|
|Tilt measurement sensitivity (rms)||5 μrad|
|Focus measurement sensitivity (rms)||3 x 10^-3 m^-1|
|Spatial resolution||~ 110 μm|
|Maximum acquisition frequency||100 Hz|
|Processing frequency (CPU 3Ghz, 512 Mb RAM)||20 Hz|
|Working wavelength range||350 – 1100 nm|
|Calibrated wavelength||In the 400-1100 nm range, details on request***|
|Extended wavelength range||Not available|
|Dimensions / weight||42x 42 x 42 mm^3 /150g|
|Working temperature||15 – 30° C|
|Interface / Power supply||USB 3.0 / 2.7 W via USB|
|Operating system||Windows 7 (32 and 64 bit) and Windows 10|
|WaveViewTM metrology software||Included|
*Wavefront as seen by the device. **Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max). ***Single wavelength calibration (+- 50 nm), second wavelength calibration available on request.