+44 (0)333 2427905
Description
Specifications:
| Property | Specification |
|---|---|
| Aperture dimension | 14.6 x 14.6 mm² |
| Number of microlenses | 128 x 128 |
| Tilt dynamic range | >±3° (1500 λ) |
| Focus dynamic range - minimum local radius of curvature | 15 mm |
| Focus dynamic range – maximum NA | >0.1 |
| Repeatability (rms) | ~λ/200 |
| Wavefront measurement accuracy in relative mode (rms)* | ~ λ/150 |
| Wavefront measurement accuracy in absolute mode (rms)** | ~ λ/100 |
| Tilt measurement sensitivity (rms) | <1 µrad |
| Focus measurement sensitivity (rms) | 2.5 x 10^-4 m^-1 |
| Spatial sampling | ~ 110 μm |
| Maximum acquisition frequency (sequential acquisition) | 7.5 Hz |
| Working wavelength range | 400 – 1100 nm |
| Calibrated wavelength range | A (400 – 600 nm), B (500 – 700 nm), C (630 – 900 nm), D (800 – 1100 nm) |
| Extended wavelength range*** | A+ (400 – 700 nm) and B+ (500 – 900 nm) |
| Dimensions (L x W x H)/ weight | 75 x 78 x 63 mm^3 /250 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | Giga Ethernet / 12 V / 6 W |
| Operating system | Windows 7 and 10 |
| HASOv3 metrology software | Included |
| External trigger | yes |
*Wavefront as seen by the device.
**Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max).
***Sold separately
