Description
AOKit Bio allows you to build the adaptive optics system that best suits your individual needs. Whichever microscopy method you are using, adaptive optics allows you to pre-compensate aberrations present in your imaging system and to improve your image quality.
Specifications:
The AOKit Bio consists of the HASO4 First wavefront sensor and the Mirao 52e electromagnetically deformable mirror. Here are the specifications of Mirao 52e :
Property | Specification |
---|---|
Number of actuators | 52 |
Maximum generated wavefront (PV) | ±50 µm |
Surface quality (rms active flat) | <10 nm |
Integrated tip/tilt correction | Yes |
Spatial frequency correction Zernike orders | Up to 6 |
Effective diameter | 15 mm |
Linearity | >95% |
Hysteresis | <2% |
Actuator input voltage | ±1V maximum* |
Coating | protected silver or gold |
Power consumption | 50W max |
Dimensions / weight | 64 x 64 x 23 mm^3 / 490g** |
Connectivity | USB 2.0 |
Operating System | Win 7 (x32 / x64), Win 10 |
*Total sum of applied voltages not to exceed 25V. **Mirror unit only.
Here are the specifications of HASO4 First:
Property | Specification |
---|---|
Aperture dimension | 3.6 x 4.6 mm² |
Number of microlenses | 32 x 40 |
Tilt dynamic range | > ± 3 ° (400 λ) |
Focus dynamic range | ± 0.018 m to ± ∞ (350 λ) |
Focus dynamic range – maximum NA | 0.1 |
Repeatability (rms) | < λ/200 |
Wavefront measurement accuracy in relative mode (rms)* | ~ λ/150 |
Wavefront measurement accuracy in absolute mode (rms)** | ~ λ/100 |
Tilt measurement sensitivity (rms) | 5 μrad |
Focus measurement sensitivity (rms) | 3 x 10^-3 m^-1 |
Spatial resolution | ~ 110 μm |
Maximum acquisition frequency | 100 Hz |
Processing frequency (CPU 3Ghz, 512 Mb RAM) | 20 Hz |
Working wavelength range | 350 – 1100 nm |
Calibrated wavelength | In the 400-1100 nm range, details on request*** |
Extended wavelength range | Not available |
Dimensions / weight | 42x 42 x 42 mm^3 /150g |
Working temperature | 15 – 30° C |
Interface / Power supply | USB 3.0 / 2.7 W via USB |
Operating system | Windows 7 (32 and 64 bit) and Windows 10 |
WaveViewTM metrology software | Included |
External trigger | yes |
*Wavefront as seen by the device. **Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max). ***Single wavelength calibration (+- 50 nm), second wavelength calibration available on request.